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ES3000 V3 NVMe PCIe SSD User Guide 20

This document provides the product information about the Huawei ES3000 V3 PCIe SSD (ES3000 V3 for short) and describes how to install, configure, operate, and maintain the ES3000 V3.
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Huawei uses machine translation combined with human proofreading to translate this document to different languages in order to help you better understand the content of this document. Note: Even the most advanced machine translation cannot match the quality of professional translators. Huawei shall not bear any responsibility for translation accuracy and it is recommended that you refer to the English document (a link for which has been provided).
Querying the Diagnosis Result of a Specified SSD

Querying the Diagnosis Result of a Specified SSD

Function

Query the diagnosis result of a specified SSD.

Format

hioadm selftest -d devicename

Parameters

Parameter Description Value
devicename Name of a device. Example: nvme0

Usage Guidelines

None

Example

# Conduct diagnosis tests for the nvme0 SSD.

[root@localhost host]# hioadm selftest -d nvme0
selftest result:            
firmware abnormal       passed  
NAND flash                passed  
NOR flash                 passed  
DDR UNC                    failed  
ibuf UNC                   passed  
capacitor                 failed  
blank block               passed  
life                        passed 
NOR flash patrol         passed 
firmware UNC              passed 
system area               passed 
bad block                  passed
controller                 passed
powerdown fiq              passed
format fail                passed
data check                 passed

System Response

Parameter

Parameter Description

Value

selftest result

Overall test result. The value is passed or empty.

If the result is success, all the following sub-tests succeed and sub-test results are not displayed.

If the result is failure, details of the following sub-tests are displayed.

Example: passed

firmware abnormal

Firmware error status test result. Values are passed and failed.

Example: passed

NAND flash

NAND flash test result. Values are passed and failed.

Example: passed

NOR flash

NOR flash test result. Values are passed and failed.

Example: passed

DDR UNC

DDR UNC test result. Values are passed and failed.

Example: failed

ibuf UNC

ibuf UNC test result. Values are passed and failed.

Example: passed

capacitor

Capacitor test result. Values are passed and failed.

Example: failed

blank block

Blank block test result. Values are passed and failed.

Example: passed

life

Life test result. Values are passed and failed.

Example: passed

NOR flash patrol

NOR patrol test result. Values are passed and failed.

Example: passed

firmware UNC

Firmware UNC test result. Values are passed and failed.

Example: passed

system area

System area test result. Values are passed and failed.

Example: passed

bad block

Bad block test result. Values are passed and failed.

Example: passed

controller

Controller validity test result. Values are passed and failed.

Example: passed

powerdown fiq

Power-off detection circuit test result. Values are passed and failed.

Example: passed

format fail

Format failure test result. Values are passed and failed.

Example: passed

data check

Data check test result. Values are passed and failed.

Example: passed

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Updated: 2019-03-12

Document ID: EDOC1000101091

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